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Secondary pattern computation of an arbitrarily shaped main reflectorThe secondary pattern of a perfectly conducting offset main reflector being illuminated by a point feed at an arbitrary location is studied. The method of analysis is based upon the application of the Fast Fourier Transform (FFT) to the aperture fields obtained using geometrical optics (GO) and geometrical theory of diffraction (GTD). Key features of the present work are (1) the reflector surface is completely arbitrary, (2) the incident field from the feed is most general with arbitrary polarization and location, and (3) the edge diffraction is calculated by either UAT or by UTD. Comparison of this technique for an offset parabolic reflector with the Jacobi-Bessel and Fourier-Bessel techniques shows good agreement. Near field, far field, and scan data of a large refelctor are presented.
Document ID
19860005007
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Lee, S. W. (Illinois Univ. Urbana, United States)
Lam, P. T. C. (Illinois Univ. Urbana, United States)
Acosta, R. J. (NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 5, 2013
Publication Date
November 1, 1985
Subject Category
Communications And Radar
Report/Patent Number
NASA-TM-87162
E-2796
NAS 1.15:87162
Accession Number
86N14477
Funding Number(s)
PROJECT: RTOP 506-62-52
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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