NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
Correction factors for on-line microprobe analysis of multielement alloy systemsAn on-line correction technique was developed for the conversion of electron probe X-ray intensities into concentrations of emitting elements. This technique consisted of off-line calculation and representation of binary interaction data which were read into an on-line minicomputer to calculate variable correction coefficients. These coefficients were used to correct the X-ray data without significantly increasing computer core requirements. The binary interaction data were obtained by running Colby's MAGIC 4 program in the reverse mode. The data for each binary interaction were represented by polynomial coefficients obtained by least-squares fitting a third-order polynomial. Polynomial coefficients were generated for most of the common binary interactions at different accelerating potentials and are included. Results are presented for the analyses of several alloy standards to demonstrate the applicability of this correction procedure.
Document ID
19780007293
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Reference Publication (RP)
Authors
Unnam, J. (NASA Langley Research Center Hampton, VA, United States)
Tenney, D. R. (NASA Langley Research Center Hampton, VA, United States)
Brewer, W. D. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 3, 2013
Publication Date
November 1, 1977
Subject Category
Metallic Materials
Report/Patent Number
NASA-RP-1006
Accession Number
78N15236
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Related Records

There are no records associated with this record.
No Preview Available