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Two-Color Laser Speckle Shift Strain Measurement SystemA two color laser speckle shift strain measurement system based on the technique of Yamaguchi was designed. The dual wavelength light output from an Argon Ion laser was coupled into two separate single-mode optical fibers (patchcords). The output of the patchcords is incident on the test specimen (here a structural fiber). Strain on the fiber, in one direction, is produced using an Instron 4502. Shifting interference patterns or speckle patterns will be detected at real-time rates using 2 CCD cameras with image processing performed by a hardware correlator. Strain detected in fibers with diameters from 21 microns to 143 microns is expected to be resolved to 15 mu epsilon. This system was designed to be compact and robust and does not require surface preparation of the structural fibers.
Document ID
19960045751
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Tuma, Margaret L. (NASA Lewis Research Center Cleveland, OH United States)
Krasowski, Michael J. (NASA Lewis Research Center Cleveland, OH United States)
Oberle, Lawrence G. (NASA Lewis Research Center Cleveland, OH United States)
Greer, Lawrence C., III (NASA Lewis Research Center Cleveland, OH United States)
Spina, Daniel (Cortez 3 Service Corp. Cleveland, OH United States)
Barranger, John (NASA Lewis Research Center Cleveland, OH United States)
Date Acquired
September 6, 2013
Publication Date
August 1, 1996
Subject Category
Lasers And Masers
Report/Patent Number
NAS 1.15:107301
E-10386
NASA-TM-107301
Meeting Information
Meeting: Optical Science, Engineering, and Instrumentation Conference
Location: Denver, CO
Country: United States
Start Date: August 4, 1996
End Date: August 9, 1996
Sponsors: Society of Photo-Optical Instrumentation Engineers
Accession Number
96N32629
Funding Number(s)
PROJECT: RTOP 505-62-50
CONTRACT_GRANT: NAS3-24816
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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