NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Polytetrafluoroethylene transfer film studied with X-ray photoelectron spectroscopyPolytetrafluoroethylene (PTFE) was rubbed against nickel in ultrahigh vacuum at loads up to 3.9 N and speeds up to 94 mm/sec. The transfer film formed on the nickel was analyzed using X-ray phototectron spectroscopy. The film was indistinguishable from bulk PTFE except for the possible presence of a small amount of NiF2. The transfer film was found to be about 1 molecule (0.5 nm) thick under all conditions; but at speeds above 10 mm/sec, there was evidence of bulk transfer in the form of fragments as well. The thickness measurements required a choice among conflicting published values of the inelastic mean free path for electrons in polymers. The values chosen gave internally consistent results.
Document ID
19810002706
Acquisition Source
Legacy CDMS
Document Type
Technical Publication (TP)
Authors
Wheeler, D. R.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 4, 2013
Publication Date
November 1, 1980
Subject Category
Nonmetallic Materials
Report/Patent Number
E-414
NASA-TP-1728
Accession Number
81N11214
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available