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Microwave microstrip resonator measurements of Y1Ba2Cu3O(7-x) and Bi2Sr2Ca1Cu2O(8-y) thin filmsRadio frequency (RF) surface resistance measurement experiments on high T(sub c) thin films were performed. The method uses a microstrip resonator comprising a top gold conductor strip, an alumina dielectric layer, and a separate superconductivity ground plane. The surface resistance of the superconducting ground plane can be determined, with reference to a gold calibration standard, from the measured quality factor of the half-wave resonator. Initial results near 7 GHz over the temperature range from 25 to 300 K are presented for YBa2Cu3O(7-x) and Bi2Sr2CaCu2O(8-y) thin film samples deposited by an electron beam flash evaporation process. The RF surface resistance at 25 K for both materials in these samples was found to be near 25 milliohms.
Document ID
19900004388
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Lichtenberg, Christopher L. (NASA Lyndon B. Johnson Space Center Houston, TX., United States)
Wosik, Jaroslaw (Houston Univ. TX., United States)
Davis, Matthew (Houston Univ. TX., United States)
Wolfe, J. C. (Houston Univ. TX., United States)
Date Acquired
September 6, 2013
Publication Date
November 1, 1989
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA-TM-102159
NAS 1.15:102159
S-601
Accession Number
90N13704
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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