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Highly automated optical characterization with FTIR spectrometryThe procedure for evaluating the characteristics of II-VI semiconducting infrared sensor materials with a Fourier Transform Infrared (FTIR) spectrometer system will be discussed. While the method of mapping optical characteristics with a spectrometer has been employed previously, this system is highly automated compared to other systems where the optical transmission data are obtained using a FTIR system with a small stationary aperture in the optical path and moving the specimen behind the aperture. The hardware and software, including an algorithm developed for extracting cut-on wavelengths of spectra, as well as several example results, are described to illustrate the advanced level of the system. Additionally, data from transverse slices and longitudinal wafers of the aforementioned semiconductors will be used to show the accuracy of the system in predicting trends in materials such as shapes of growth interfaces and compositional uniformity.
Document ID
19890020141
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Perry, G. L. E. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Szofran, F. R. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 6, 2013
Publication Date
September 1, 1989
Subject Category
Inorganic And Physical Chemistry
Report/Patent Number
NAS 1.15:100379
NASA-TM-100379
Accession Number
89N29512
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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