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Surface Diagnostics in Tribology Technology and Advanced Coatings DevelopmentThis paper discusses the methodologies used for surface property measurement of thin films and coatings, lubricants, and materials in the field of tribology. Surface diagnostic techniques include scanning electron microscopy, transmission electron microscopy, atomic force microscopy, stylus profilometry, x-ray diffraction, electron diffraction, Raman spectroscopy, Rutherford backscattering, elastic recoil spectroscopy, and tribology examination. Each diagnostic technique provides specific measurement results in its own unique way. In due course it should be possible to coordinate the different pieces of information provided by these diagnostic techniques into a coherent self-consistent description of the surface properties. Examples are given on the nature and character of thin diamond films.
Document ID
19990032184
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Miyoshi, Kazuhisa (NASA Lewis Research Center Cleveland, OH United States)
Date Acquired
September 6, 2013
Publication Date
February 1, 1999
Subject Category
Nonmetallic Materials
Report/Patent Number
NAS 1.15:208527
NASA/TM-1999-208527
E-11460
Meeting Information
Meeting: IMECO
Location: Osaka
Country: Japan
Start Date: June 13, 1999
End Date: June 15, 1999
Sponsors: Society of Instrument and Control Engineers
Funding Number(s)
PROJECT: RTOP 523-22-13
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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